Visualization of a Buried Organic Interface by Imaging TOF-SIMS and Scanning Auger Microprobe of an Ion Beam Crater Edge.

Abstract

A method has been developed for chemically imaging a buried organic interface of thickness similar to that of a biological conditioning film. Using an ion beam to form a sputter crater, elemental analysis of the edge of the crater is performed using Auger Electron Spectroscopy (AES) and chemical imaging of the edge is performed by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). The crater edge that is formed due to the shape of the ion beam and geometry of the spectrometer has the ability to magnify the interfaces by lOOOx. Samples mimicing titanium bone implant protheses were analyzed to demonstrate the feasibility of the method. jg p.5

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1994
Accession Number
ADA296515

Entities

People

  • Gary L. Jones
  • Joseph A. Gardella Jr.
  • Larry B. Davis
  • Patrick C. Schamberger
  • Patrick J. Mckeown

Organizations

  • University at Buffalo

Tags

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Electron Spectroscopy
  • Ion Beams
  • Ions
  • Mass Spectrometry
  • Spectrometers
  • Spectrometry
  • Spectroscopy

Fields of Study

  • Physics

Readers

  • Explosive Engineering.
  • Image Processing and Computer Vision.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene