Uncertainties in Reflectance Measurements Made on the NRL Beam Line X24C.

Abstract

A comprehensive attempt has been made to identify and quantify sources of uncertainty associated with measurements made with the reflectometer on the NRL beam line X24C. Measuremental uncertainty is dominated by angular reproducibility in the reflectometer and the stability of the electron beam. At wavelengths near the silicon L edge, the error in wavelength scale, set by the monochromator, is about 0.3 Angstroms. In samples with good signal to noise, the error in the reflectance is about 1 % of the value of the reflectance. The error is correlated with the slope of the reflectance profile, varying between 1 % of the reflectance value where the slope is flat to 10% of the reflectance value where the slope is steep.

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Document Details

Document Type
Technical Report
Publication Date
Jul 17, 1995
Accession Number
ADA297009

Entities

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Angle Of Incidence
  • Computer Programs
  • Data Acquisition
  • Detectors
  • Electron Beams
  • Electrons
  • Grazing Angles
  • Light Sources
  • Measurement
  • Military Research
  • Monochromators
  • Radiation
  • Reflectance
  • Reflectometers
  • Reproducibility
  • Uncertainty

Fields of Study

  • Physics

Readers

  • Pulsed Power and Plasma Physics.
  • Spectroscopy.

Technology Areas

  • Directed Energy
  • Microelectronics