Studies in Scanning Probe Microscopy.

Abstract

The following is a final report on our work in the field of Scanning Probe Microscopy (SPM), which has been funded by the AFOSR under Contract #F49620-92-J-0164. The AFOSR funding was instrumental in the establishment of a multi-lab facility at the Optical Sciences Center, which performs research in SPM using two ultrahigh vacuum (UHV) STM facilities, and several Atomic Force Microscopy (AFM) facilities. The fabrication and characterization work performed in the SPM Laboratory is supplemented by infrared (IR) spectroscopy, high resolution transmission electron microscpy (HRTEM), and scanning electron microscopy (SEM), available in other departments on campus. The report covers the following areas: (1) GaAs and CdSe Structures, (2) Optical Interactions on a nm and nsec Scales, (3) Fullerenes on Gold, (4) Fullerenes on MoS2, (5) Fullerenes on Si, (6) SiC, (7) Nanotubes, (8) Scanning Force Microscopy, and (9) Biology. jg

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1995
Accession Number
ADA297561

Entities

People

  • Dror Sarid

Organizations

  • University of Arizona

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Charge Carriers
  • Films
  • Fullerenes
  • Helium Neon Lasers
  • Laser Diodes
  • Lasers
  • Materials Laboratories
  • Microscopy
  • Monitoring
  • Scanning
  • Semiconductor Junctions
  • Semiconductors
  • Silicon Carbide
  • Thin Films

Fields of Study

  • Physics

Readers

  • Aerial Delivery - Logistics and Supply Chain Management.
  • Research Science/Academic Research
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene