Analyzing VLSI Component Test Results of a GenRad GR125 Tester.
Abstract
The GenRad GR125 VLSI chip tester provides tools for testing the functionality of entire chips. Test operation results, such as timing sensitivity or propagation delay, can be compared to published values of other manufacturers' chips. The tool opt ions allow for many input vector situations to be tested, leaving the possibility that a certain test result has no meaning. Thus, the test operations are also analyzed for intent. Automating the analysis of test results can speed up the testing process and prepare results for processing by other tools. The procedure used GR125 test results of a 7404 Hex Inverter in a sample VHDL performance modeler on a Unix workstation. The VHDL code is simulated using the Mentor Graphics Corporation's Idea Station software, but should be portable to any VHDL simulator.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1995
- Accession Number
- ADA297729
Entities
People
- C. -h. Lee
- D. Zulaica
Organizations
- Naval Postgraduate School