Crystal Diffraction Spectrometry for Accurate, Non-Invasive kV/Spectral Measurement for Improvement of Mammographic Image Quality.
Abstract
Phase one of this contract has been devoted to the development and demonstration of the MST prototype crystal spectrometer which was designed to provide accurate measurement of x-ray source voltage and full spectral characterization of the radiation emitted from mammographic x-ray sources. A major advance has been the movement from film to solid state image registration. Our current systems take advantage of recently introduced large area digital radiography sensors which are now being used in place of dental film. Initial clinical trials indicated the need for improved detection quantum efficiency. This has been overcome primarily by increasing the crystal bandpass with an air abrasive treatment of the surface and retrofitting the sensor with a thicker scintillating material. The significance of these advances is that we now have an instrument which: measures kVp to an accuracy in excess of clinical requirements, is easily adaptable to the clinical setting, records the entire spectral profile, including the effects of both inherent and added filtration, and is sensitive enough to obtain these data within the time of a typical mammographic exposure. Not only will this contribute to the quality control of mammography but potentially to refinements in technique.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 30, 1995
- Accession Number
- ADA297943
Entities
People
- Larry Hudson
- Richard D. Deslattes
Organizations
- National Institute of Standards and Technology