Electron Paramagnetic Resonance and X-Ray Photoelectron Spectroscopy Investigations of Fe Doped and H+ Implanted Indium Phosphide,

Abstract

In this report, results of electron paramagnetic resonance (EPR), electron nuclear double resonance (ENDOR) and x-ray photoelectron spectroscopy (XPS) studies of iron doped, proton implanted indium phosphide will be presented. The EPR spectra were obtained both as a function of sample angle relative to the magnetic field and as a function of temperature at a given orientation. The results obtained in this study again confirm that the environment around the 3+ Fe centers is indeed octahedral. In addition, the EPR spectra indicate that there are defects present that behave very much like a spin glass (magnetically diluted defects present in a material with cooperative interactions between the centers that are most distinctly observable at definite temperatures and magnetic field strengths). These results along with the results from the XPS and ENDOR measurements will be presented and discussed in this report.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1995
Accession Number
ADA298711

Entities

People

  • Margaret H. Rakowsky
  • W. K. Kuhn

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors

DTIC Thesaurus Topics

  • Air Force
  • Band Gaps
  • Band Spectra
  • Crystal Lattices
  • Crystal Structure
  • Crystals
  • Cubic Lattices
  • Electron Paramagnetic Resonance
  • Electrons
  • Energy Bands
  • High Resolution
  • Low Temperature
  • Magnetic Fields
  • Paramagnetic Resonance
  • Spectroscopy
  • Valence Bands
  • X Ray Photoelectron Spectroscopy

Fields of Study

  • Materials science
  • Physics

Readers

  • Materials Science and Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene