II-VI/III-V Heterojunctions.

Abstract

Use of the Mg containing quaternary led to a pseudomorphic SCH laser. The graded bandgap ohmic contact reduced threshold voltages to 5 volts as room temperature cw was obtained. TEM studies provided the first reports of compositional modulation in a II-VI alloy. It was found that the quaternary above a certain bandgap exhibited a compositional modulation in a particular <110> direction. Laser degradation has been studied using electroluminescence microscopy and TEM of degraded devices. The microstructural analysis revealed that the degradation originated from stacking faults nucleated at or near the II-VI/III-V interface. Using etching techniques it was determined that room temperature cw lasers had stacking fault densities of 3x10(exp 5) to 1x10(exp 6)/sq cm. Recently we have emphasized reducing these densities. We have reached the 10(exp3)/sq cm and are consistently in the low 10(exp 4)/sq cm. It appears that the high resistivity observed in p-type wide bandgap alloys is the manifestation of a DX-like behavior. Although previous studies reported DX centers in many n-type semiconductors there are no previous report for acceptors in any p-type semiconductor; we named this phenomenon an AX center.

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Document Details

Document Type
Technical Report
Publication Date
Jul 31, 1995
Accession Number
ADA299965

Entities

People

  • Robert L. Gunnshor

Organizations

  • Purdue University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Crystals
  • Electro-Optics
  • Electron Microscopy
  • Electronics Laboratories
  • Epitaxial Growth
  • Heterojunctions
  • Laser Diodes
  • Lasers
  • Materials Science
  • Microscopy
  • Modules (Electronics)
  • Optical Properties
  • Optics
  • Power Electronics
  • Quantum Wells
  • Semiconductors

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics