Adsorbed Water Layer Thickness on Quartz Fibers as a Function of Humidity as Measured By Light Scattering.

Abstract

This paper applies the Mueller scattering matrix for cylindrical quartz fibers to determine the buildup of thin water sheaths on the fibers as a function of humidity. We created four quartz fibers of various sizes and used a controlled-humidity environment to establish a relationship between relative humidity and water sheath thickness. We determined the thickness by measuring a particular Mueller scattering matrix at a single angle and relating changes in polarized light scattering (Sij) directly to the thickness of the water layer. We report an accelerated growth of a water sheath on quartz fibers at humidities above 90% and an irregular relationship between the fiber radius and the maximum size for a water layer. (MM)

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Document Details

Document Type
Technical Report
Publication Date
Sep 20, 1995
Accession Number
ADA300171

Entities

People

  • Joseph P. Kendall

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Circular Polarization
  • Diffraction
  • Electric Fields
  • Equations
  • Geometry
  • High Humidity
  • Humidity
  • Laser Beams
  • Light Scattering
  • Measurement
  • Polarization
  • Polarizers
  • Refraction
  • Refractive Index
  • Scattering
  • Water Vapor

Fields of Study

  • Physics

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Optical Physics and Photonics.
  • Surface Coatings Technology.