Defect Formation in Fused Silicas Due to Photon Irradiation at 5 and 50 EV.

Abstract

We have compared the paramagnetic defect formation in two types of pure fused silica glass irradiated with intense photon fluxes at 5 eV (KrF laser) and 50 eV (undulator beam from Aladdin Synchrotron Light Source), using electron paramagnetic resonance spectroscopy with a frequency of 9.7Hz and sample temperatures of 110 and 300K. The 5 eV photons produce approximately 10(exp -14) paramagnetic defects per photon and the 50 eV photons produce approximately 10(exp -5) defects per photon. The ratio of E' centers to oxygen related centers is approx. 10 times greater for 5 eV photons than for 50 eV photons in type III silica.

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Document Details

Document Type
Technical Report
Publication Date
Jan 31, 1991
Accession Number
ADA302773

Entities

People

  • D. L. Kinser
  • G. Escher
  • N. H. Tolk
  • P. W. Wang
  • R. F. Haglund Jr.

Organizations

  • Vanderbilt University

Tags

Communities of Interest

  • Biomedical

DTIC Thesaurus Topics

  • Absorption Coefficients
  • Contracts
  • Diameters
  • Electron Paramagnetic Resonance
  • Electrons
  • Excimer Lasers
  • Free Electron Lasers
  • Free Electrons
  • Laser Beams
  • Lasers
  • Light Sources
  • Materials
  • Materials Science
  • Paramagnetic Resonance
  • Radiation
  • Rate Of Formation
  • Synchrotron Radiation

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Pulsed Power and Plasma Physics.

Technology Areas

  • Directed Energy
  • Directed Energy - Lasers
  • Microelectronics