Instrumentation for Spatially Resolved Composition Mapping in the Electron Microscope.

Abstract

Analytical equipment for spatially resolved composition mapping in the electron microscope has been purchased in accordance with the originally proposed intent of the grant. A scanning beam attachment for scanning transmission electron microscopy (STEM) has been acquired as well as attachments for composition mapping utilizing characteristic X-ray signals (EDS) and electron energy loss signals (Gatan Imaging Filter).

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Document Details

Document Type
Technical Report
Publication Date
Dec 11, 1995
Accession Number
ADA304039

Entities

People

  • Samuel P. Gido

Organizations

  • University of Massachusetts Amherst

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Attachment
  • Detectors
  • Electron Beams
  • Electron Energy
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • Energy
  • High Resolution
  • Images
  • Instrumentation
  • Microscopes
  • Microscopy
  • Scanning
  • Spectra
  • Transmission Electron Microscopy
  • X Rays

Fields of Study

  • Physics

Readers

  • Plasma Physics.
  • Powder metallurgy of Titanium alloys.
  • Research Science/Academic Research

Technology Areas

  • Microelectronics