Global Mapping of Bidirectional Reflectance and Albedo for the EOS MODIS Project: The Algorithm and the Product,

Abstract

The MODIS BRDF/Albedo Product will provide multi-band BRDF parameters and albedo measures at 1 km resolution globally every 16 days, utilizing both MODIS and MISR data. The BRDF models to be used are kernal driven semi-empirical models based mostly on Ross and Li kernels. These are capable of fitting directional data observed for different land cover types by Kimes as well.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1995
Accession Number
ADA304611

Entities

People

  • Alan H. Strahler
  • Jan-peter Muller
  • Mike Barnsley
  • Philip Lewis
  • Wolfgang Wanner

Organizations

  • Phillips Laboratory

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Abstracts
  • Algorithms
  • Atmospheres
  • Classification
  • Climate Change
  • Directional
  • Electronic Mail
  • Forests
  • Illumination
  • Optical Properties
  • Physical Properties
  • Radiative Transfer
  • Reflectance
  • Remote Sensing
  • Scattering
  • Surface Properties
  • Universities

Fields of Study

  • Environmental science

Readers

  • Atmospheric Remote Sensing.
  • Statistical inference.