A Pansophic Approach for Reliability Growth for One-Shot Devices.

Abstract

This report provides an approach using System Engineering Principles to the Reliability Growth for One-Shot Devices.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1996
Accession Number
ADA306560

Entities

People

  • Mohammad H. Danesh

Organizations

  • United States Army Aviation and Missile Command

Tags

Communities of Interest

  • Cyber
  • Materials and Manufacturing Processes
  • Weapons Technologies

DTIC Thesaurus Topics

  • Abstracts
  • Circuit Analysis
  • Classification
  • Delta Functions
  • Differential Equations
  • Electrical Engineering
  • Engineering
  • Environment
  • Failure Mode And Effect Analysis
  • Frequency
  • Reliability
  • Reliability Engineering
  • Security
  • Signal Processing
  • Simulations
  • Test And Evaluation
  • Test Methods