Optical Switch Evaluation.

Abstract

We have evaluated nonlinear interface optical switches (NIOS) based on thin films of laser deposited metal oxide clusters. Films having nominal thickness 200nm and ranging in stoichiometry from WO2.6 to WO2.5, were evaluated in at least two configurations. Wanting to understand the considerable optical nonlinearity exhibited by these laser deposited group VI metal oxide cluster films, time resolved and other Raman experiments were conducted using WO3 powder. In addition to helping explain the results of the NIOS testing, these and subsequent experiments revealed a phenemenon with considerable potential for optical switch, memory and other optical computing applications. Using this phenomenon, we conclude by discussing the viability of optical memory systems using the new media.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1996
Accession Number
ADA307799

Entities

People

  • Joseph M. Osman

Organizations

  • Rome Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Films
  • Metal Oxides
  • Oxides
  • Stoichiometry
  • Test And Evaluation
  • Thickness
  • Thin Films
  • Viability

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Powder metallurgy of Titanium alloys.
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition