Target Description Specifications for the Conduct of Integrated Analysis.

Abstract

The Survivability/Lethality Analysis Directorate (SLAD) represents the combination of three previously separate Army Laboratory Command (LABCOM) components that have led Army survivability, lethality, and vulnerability (SLV) research. SLAD responsibilities are to evaluate the SLV of Army systems against the full spectrum of battlefield threats. The divisions of SLAD conduct extensive simulations and investigations of system SLV performance against conventional ballistic, nuclear, chemical, biological, and electronic threats or targets. One of the technology-based program goals is to develop tools for the analysts to conduct studies that consider combined effects from all battlefield threats. This integrated analysis, we speculate, can be fostered by the three divisions working from a common target description (in BRL-CAD). The scope of the target description requirements specifies a general target description for integrated analysis across the divisions of SLAD. Discussions are of a general nature and address the specific types of threats for which the different elements of SLAD are responsible and how these specific threats interact (or couple) with the targets. Requirements for target description construction, resolution, and possible changes to the BRL-CAD program are discussed. This report was presented at the 1995 BRL-CAD Symposium, at Aberdeen Proving Ground, MD, 6-8 June 1995.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1996
Accession Number
ADA307954

Entities

People

  • Jose G. Reza
  • Richard L. Zum Brunnen
  • Robert W. Kunkel Jr.

Organizations

  • United States Army Research Laboratory

Tags

DTIC Thesaurus Topics

  • Battlefields
  • Construction
  • Lethality
  • Simulations
  • Specifications
  • Spectra
  • Survivability
  • Vulnerability

Readers

  • Business Analytics
  • Defense Technology Research and Development.
  • Sensor Fusion and Tracking Systems.

Technology Areas

  • Microelectronics