Electrochemical Digital Etching: Atomic Level Studies of CdTe(100).

Abstract

Atomic level control in the etching of CdTe(100) is being investigated, in an attempt to develop an electrochemical digital etching procedure. In principle, surface atoms on the crystal should show higher reactivity than those contained on the interior, due to their decreased coordination. Electrochemical oxidation in 50 mM K2SO4, resulted in removal of the surface Cd atoms and a tellurium enriched surface, as observed by Auger electron spectroscopy. Subsequent reduction at -1.8V reduced the surface excess of Te, and returned the surface composition to stoichiometric. Selection of an appropriate potential for the oxidation of surface cadmium atoms was complicated by the observation that bulk CdTe is oxidized at potentials close to that used to oxidize the surface cadmium atoms.

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Document Details

Document Type
Technical Report
Publication Date
Jun 25, 1996
Accession Number
ADA310782

Entities

People

  • Belinda K. Wilmer
  • John L. Stickney
  • Tom A. Sorenson

Organizations

  • University of Georgia

Tags

DTIC Thesaurus Topics

  • Auger Electron Spectroscopy
  • Auger Electrons
  • Electron Spectroscopy
  • Electrons
  • Observation
  • Oxidation
  • Reactivities
  • Spectroscopy
  • Tellurium

Fields of Study

  • Materials science

Readers

  • Mathematics or Statistics
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene