Measurement and Analysis of Electro-Optical Materials and Devices.
Abstract
A description is given of the research and experimental work accomplished on the injection of phosphorus into an indium melt. Two crystal growing techniques were used to produce single crystals of InP. Three little used crystal growth techniques are discussed for growing nonlinear optical materials. Device processing techniques covering the use of an ultra high vacuum deposition system for evaporating a dielectric layer of silicon monoxide is described. Nonlinear materials have been studied for applications in optical computing and optical signal processing. Photorefractive and resonant nonlinear optical interactions have been studied, and are described regarding crystal fields in solids and collisions in vapors. Also, the nonlinear optical properties of an atomic beam were studied and researched. Work was completed regarding the redesign of a video board to shrink the entire electronics package for the B52 FLIR camera project. Details are given concerning equipment used in a research program to obtain zero reflection using a single or multi-layer coating of SiN on the surface of a GaAlAs side emitting laser diode.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1996
- Accession Number
- ADA311623
Entities
People
- A. F. Armington
- D. R. Gabbe
- J. A. Adamski
- J. H. Bloom
- William J. Higgins