Particle Surface Layer Characterization Using Ion Beam Analysis.
Abstract
Surface contaminants on powders used in powder metallurgy and ceramics processing can be responsible for serious degradation of the product properties. The elimination of such contamination, or at least the tailoring of its properties for improved performance, requires the ability to determine its nature accurately. Ion beam analysis techniques are used to provide quantitative characterization of such contamination. In this report, we describe two methods for adapting well-known backscattering spectroscopy techniques for use on samples consisting of small spherical or cylindrical particles. The limitations and relative strengths and weaknesses, of each method will be discussed. Examples of the use of these methods in conjunction with Rutherford Backscattering Spectroscopy will be shown, although they are also applicable to other types of ion beam analysis.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1996
- Accession Number
- ADA313848
Entities
People
- Andrus Niiler
- Paul R. Berning
Organizations
- United States Army Research Laboratory