Reliability Assessment of Opto-Electronic Integrated Circuits.
Abstract
This effort examined the functionality of 30 emitter coupled, logic, compatible phase modulators and 30 bias controlled modulators under various environments. The devices were subjected to thermal cycling, vibration, and temperature/humidity to evaluate the long-term performance of the optical and electronic portions of the devices. Thermal cycling and vibration testing did not cause optical failures. Subjecting the devices to high temperatures combined with high humidity (85 deg C/90% relative humidity) resulted in failures in the lid and fiber seal. Once moisture is allowed to enter the package, the water vapor reacts with the epoxies in the package, which then soften and darken. Laser welding the package lid and newly developed humidity resistant fiber seals extend the survival range to over 2,000 hours at 100 deg C/100% humidity.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1996
- Accession Number
- ADA314089
Entities
People
- Hogan Eng
- Karl M. Kissa