(AASERT-92) Ballistic Electron Emission Microscopy for Improving Schottky-Barrier IR Detectors.

Abstract

This grant was used to support the research work of a graduate student (Byong Kim) on this project which was for us to improve the understanding of internal photoemission for Schottky-barrier IR detectors (SBIRDs) and to attempt to use this improved understanding to design either more efficient SBIRDs or SBIRDs with improved wavelength of operation or to increase the operating temperature. We used the newly developed technique of ballistic electron emission microscopy to carry out this work.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1996
Accession Number
ADA317067

Entities

People

  • L. J. Schowalter

Organizations

  • Rensselaer Polytechnic Institute

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Structures
  • Crystal Lattice Vibrations
  • Detectors
  • Diffraction
  • Elastic Scattering
  • Electron Emission
  • Electrons
  • Emission
  • Energy Bands
  • Epitaxial Growth
  • Fermi Levels
  • Infrared Detectors
  • Microscopes
  • Microscopy
  • Photoexcitation
  • Scattering
  • Semiconductors

Readers

  • Materials Science and Engineering.
  • Research Science/Academic Research
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics