In Situ STM and UHV-EC: Complementary, not Competiting, Techniques.

Abstract

The development of in situ scanning tunneling microscopy (STM) has opened new avenues of research in electrochemical surface science. By itself, this nanometerscale structural tool cannot be regarded as a panacea for the many problems that confront researchers in the interfacial sciences. However, when employed in tandem with other surface-sensitive analytical methods, even exceedingly complex processes can be investigated. Two cases are presented here that showcase the power of in situ STM coupled with combined ultrahigh vacuum-electrochemistry (UHV-EC) techniques.

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Document Details

Document Type
Technical Report
Publication Date
Oct 15, 1996
Accession Number
ADA317319

Entities

People

  • John L. Stickney
  • Kingo Itaya
  • Manuel P. Soriaga

Organizations

  • University of Georgia

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Atomic Layer Epitaxy
  • Bulk Materials
  • Chemistry
  • Compound Semiconductors
  • Crystals
  • Electrochemistry
  • Electrodeposition
  • Electron Diffraction
  • Engineering
  • Images
  • Materials
  • Materials Science
  • Military Research
  • Semiconductors
  • Single Crystals
  • Surface Chemistry
  • Universities

Fields of Study

  • Physics

Readers

  • Electrochemical Surface Science
  • Systems Analysis and Design
  • Thin Film Deposition Science.