Defects and Impurities in 4H- and 6H-SiC Homoepitaxial Layers: Identification, Origin, Effect on Properties of Ohmic Contacts and Insulating Layers and Reduction.

Abstract

A SiC CVD system has been assembled to grow and dope 4H- and 6H-SiC thin films. The design incorporates a separate load lock from which the growth chamber and a RHEED chamber are attached. Power supply components remain to be received. Comparisons between the wetting characteristics of the on- and off-axis as well as the oxidized and unoxidized 6H-SiC(0001)subSi surfaces in various acids and bases were made to that of Si(111). Both on- and off-axis oxidized 6H surfaces were hydrophilic after removal of the oxide with 10:1 HF and rinsing in DI water. In contrast, it was observed that both on and off axis as received/as polished (0001)subSi 6H-SiC surfaces were hydrophobic before and after dipping in 10:1 HF. Wet chemical cleans, specifically, RCA SC1 (1:1:5 NH3OH:H2O2:H2O) and Piranha Etch (7:3 H2SO4:H2O2) converted these hydrophobic surfaces into hydrophilic surfaces. The use of 200 A of Si as a hydrophobic passivating layer has also been demonstrated. As deposited NiAl, Au, Ni, and Pt contacts were rectifying on p-type 6H-SiC with very low leakage current densities (^1x10(exp -8) A/sq cm at 10 V) and displayed a similar Schottky barrier trend as previously found for n-typeH-SiC. Ni/NiAl contacts on p-type (1x10(exp 19)/cu cm) SiC were ohmic after annealing for 10-80 S at 1000 deg C with a specific contact resistivity of 2-3x10(exp -2) Ohms .sq cm. Cr-B contacts were semi-ohmic on p-type SiC (1x10(exp 18)/sq cm) after annealing at 1000 deg C for 60-240 s in Ar, but became rectifying after annealing for 300 s, a result which may be due to the formation of B4C. Oxidation of the Cr-B contacts was not observed. A mask set and associated MOS capacitors and MOS gated diodes on 4H- and 6H-SiC(0001) were designed and fabricated to characterize the SiO2/SiC interfaces.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1996
Accession Number
ADA317435

Entities

People

  • Bayant Jayant Baliga
  • M. O. Aboelfotoh
  • Robert F Davis
  • Robert J. Nemanich

Organizations

  • North Carolina State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Annealing
  • Capacitors
  • Contrast
  • Current Density
  • Films
  • Hydrophilic Properties
  • Hydrophobic Properties
  • Identification
  • Impurities
  • Metal-Semiconductor Junctions
  • Oxidation
  • Oxides
  • Physical Properties
  • Power Supplies
  • Thin Films

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene