X-Ray Diffraction Characterization of Process-Induced Residual Stress.
Abstract
The U.S. Army Research Laboratory - Materials Directorate (ARL-MD) has utilized the x-ray diffraction (XRD) method of residual stress analysis (RSA) to characterize process-induced residual stress on a variety of polycrystalline metal and ceramic materials. As part of the mechanical failure investigation, modem XRD RSA techniques provide a direct means for quantifying residual stress at the component surface - the location at which most fatigue and stress corrosion cracks originate. Therefore, an understanding of the magnitude and distribution of residual stresses introduced from processing is important when predicting failure modes through fracture mechanics calculations and service loads by finite element modeling. This report discusses the procedures for and results from XRD residual stress measurement on the following differently processed material systems: shot-peened stainless steel, quenched and tempered and welded armor steel, autofrettage gun tube steel, and ground alumina ceramic.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1996
- Accession Number
- ADA317616
Entities
People
- Daniel J. Snoha
Organizations
- United States Army Research Laboratory