Scanning Microcathodoluminescence and Near-Field Optical Scanning Microscopy of Nanostructures in Semiconductors (AASERT Award).

Abstract

This report briefly summarizes work completed on the above grant during the time period of June 1, 1993 to May 31, 1996. The grant, an AASERT Award to support the work of one graduate student, supplemented a larger ONR grant (N00014-90-J-1306) and expanded the effort in that grant to scanning tunneling luminescence(STL) microcathodoluminescence (micro CL), and near-field scanning optical microscopy (NSOM). The objective has been to use these new techniques for investigating local optical properties of surfaces and small structures and relating these to morphological properties and structural defects. The project has been quite successful, in that we were able to develop a functional STL capability and use it for initial studies of localized luminescence on GaAs and GaN. In addition, the objective motivated research on improved scanning technology for scanned-probe instruments, which has led to an invention disclosure and the filing of a patent application by the University.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1996
Accession Number
ADA319709

Entities

People

  • Max G. Lagally

Organizations

  • University of Wisconsin–Madison

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Electrons
  • Luminescence
  • Materials
  • Microscopy
  • Military Research
  • Nanomaterials
  • Nanostructures
  • Near Field
  • Optical Properties
  • Optical Scanning
  • Patent Applications
  • Patents
  • Scanning
  • Semiconductors
  • Silicon Carbide
  • United States Government

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Research Science/Academic Research
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics