High Temperature X-Ray Diffractometer for Advanced Materials Research.
Abstract
The X-ray diffractometer system purchased under the grant consists of an X-ray generator and associated equipment for determination of degree of crystallinity, crystallite size and lattice distortion in nano-and micro-crystalline metals and composites; identification of crystalline phases, precision measurement of lattice constants, and determination of phase transformation temperatures in metals, ceramics, and composites at 25-1400 degrees Celsius; determination of grain orientations, preferred orientation, and crystallographic texture by Laue back reflection pole figure mapping.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 25, 1995
- Accession Number
- ADA319997
Entities
People
- Shankar M. Sastry
- William E. Buhro
Organizations
- Washington University in St. Louis