Study of Graded Channels in MODFETs on InP Substrates.
Abstract
Results from this contract was a successful demonstration for the first time of InP-based MODFETs operating above 125 deg C with minimal DC and RF degradation with record two dimensional electron sheet densities (>8.0 x 10(exp 12) /sq cm) The MODFET structure was double-doped and double-strained with a parabolically graded channel. To achieve this final result we performed fundamental experiments during the duration of the grant to study the spacer layer thickness, Schottky barrier enhancements and stress compensation schemes.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1996
- Accession Number
- ADA321520
Entities
People
- Glenn Martin
- Lester Eastman
Organizations
- Cornell University College of Engineering