Design of a Universal Test Platform for Radiation Testing of Digital Components.

Abstract

In this research, programmable, microcontroller-based test hardware was designed, constructed, debugged, and programmed. The wire-wrapped board will be used to test two custom static random access memory (SRAM) chips, as well as other custom chips designed at the Naval Postgraduate School. Components for the test hardware were selected to allow prototyping with standard parts that can later be replaced with radiation hardened parts as budgets permit. Control of the test hardware is via a RS-232 serial interface, which allows remote control programming and monitoring of the test hardware and device being tested.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1996
Accession Number
ADA322563

Entities

People

  • Duane E. Amsler Jr

Organizations

  • Naval Postgraduate School

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Space

DTIC Thesaurus Topics

  • Coding
  • Computer Programming
  • Computer Programs
  • Computers
  • Digital Signal Processing
  • Electrical Engineering
  • Fabrication
  • Low Temperature
  • Memory Devices
  • Operating Systems
  • Radiation
  • Radiation Effects
  • Semiconductors
  • Standards
  • System Software
  • Test Fixtures
  • Wiring Diagrams

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering