Microstructures of Mercury-Based Cuprate Thin Films.

Abstract

The microstructures of mercury-based cuprate thin films have been studied using a scanning electron microscope and an energy dispersive x-ray spectrometer. Besides rough surface, several types of defects including HgCaO2 phase are identified on those films made using a slow temperature ramping Hg-vapor annealing process. By ramping the sample temperature rapidly to the annealing temperature, the surface morphology of the film is significantly improved and the impurity phases, especially the HgCaO2 phase, are effectively reduced.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1997
Accession Number
ADA323248

Entities

People

  • Donald W. Eckart
  • J. Z. Wu
  • S. H. Yun
  • Steven C. Tidrow

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Annealing
  • Detectors
  • Diffraction
  • Electron Microscopes
  • Electron Microscopy
  • Films
  • High Temperature
  • Impurities
  • Information Processing
  • Materials
  • Microscopes
  • Microstructure
  • Military Research
  • Scanning Electron Microscopes
  • Scanning Electron Microscopy
  • Thin Films
  • X Rays

Fields of Study

  • Materials science

Readers

  • Allergy and Immunology.
  • Powder metallurgy of Titanium alloys.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene