Crystal Diffraction Spectrometry for Accurate, Non-Invasive KV/Spectral Measurement for Improvement of Mammographic Image Quality.
Abstract
This contract has been devoted to the development and demonstration of the NIST prototype crystal spectrometer which was designed to provide accurate measurement of x-ray source voltage and full spectral characterization of the radiation emitted from mammographic x-ray sources. A major advance has been the movement from film to solid state image registration. Studies in a clinical environment led to refinements in packaging and portability, and revealed the need to increase device sensitivity. The detection efficiency was increased manyfold by optimum choice of diffracting crystal plane and modification of the CCD sensor package.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1996
- Accession Number
- ADA323986
Entities
People
- Lawrence T. Hudson
- Richard D. Deslattes
Organizations
- National Institute of Standards and Technology