Photothermal Imaging of Indentation in Silicon Nitride.

Abstract

Theoretical model for determination of temperature distribution in ceramics with a lateral crack is developed for a case of photothermal measurements of indentation cracks. The lateral crack is modeled by a horizontal buried layer with a given thermal resistance. A possible penetration of the pump beam light in ceramics is taken into account. The dependence of photo acoustic and photodeflection signals on the thermal resistance and pump beam light in ceramics are investigated. Photodeflection and piezoelectric images of indentation cracks in silicon nitride have been obtained. It is shown that these images have different structure and can be used for the development of a complex approach to the problem of indentation crack imaging in silicon nitride ceramics.

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Document Details

Document Type
Technical Report
Publication Date
Sep 01, 1996
Accession Number
ADA325054

Entities

People

  • Alexej L. Glazov
  • Kyrill L. Muratikov

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Ceramic Materials
  • Detection
  • Equations
  • Laser Beams
  • Materials
  • Measurement
  • Microscopy
  • Reflection
  • Residual Stress
  • Resistance
  • Simulations
  • Surface Temperature
  • Technical Ceramics
  • Thermal Conductivity
  • Thermal Diffusivity
  • Thermal Resistance
  • Two Dimensional

Readers

  • Materials Science (Mechanical Engineering).
  • Optical Physics and Photonics.
  • Thin Film Deposition Science.