Advanced Electro-Optical System Hardening: Phase II: Computer-Aided Susceptibility Analysis of the HOST Sensor Amplifier to IEMP.

Abstract

This report supplied support to the Harry Diamond Laboratories on the effects of IEMP-induced transient pulses on the HOST detector amplifier. Computer simulation techniques were used to model the circuit's response to 1-microsecond current pulses injected at the selected circuit locations. The most vulnerable subcircuit within the amplifier was found to be the detector bias power supply. Permanent damage was predicted to occur at the bias control input point for a cable response, resulting in the pickup of a 61-V, 0.064-A pulse, or greater.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1974
Accession Number
ADA325726

Entities

People

  • John L. Gilbert

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Sensors
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Ballistic Missiles
  • Circuit Analysis
  • Circuits
  • Computer Simulations
  • Electronics
  • Electronics Laboratories
  • Field Effect Transistors
  • Gamma Rays
  • Impedance
  • Integrated Circuits
  • Ionizing Radiation
  • Materials
  • Operational Amplifiers
  • Resistance
  • Semiconductors
  • Simulations
  • Zener Diodes

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Pulsed Power and Plasma Physics.