The Study of Shock Launching in Silicon by Pulsed X-Ray Diffraction.

Abstract

Multikilobar shocks were launched into a single crystal of (111) silicon overcoated with 1000 A aluminum and a 25 micron transparent plastic layer by irradiation with a 1 nsec pulse of 1.06 microcron laser light at 0.8-8 J cm(exp -2). Peak lattice compressions (densities) were directly measured and shocked lattice stresses inferred as a function of irradiance and time by Bragg diffracting a short (<100 psec) burst of probing x-rays through the shock launching region. Compressions of up to ^4% were measured, corresponding to stresses of order 70 Kbar, at irradiances of ^4 x 10(exp 9) W cm(exp -2).

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Document Details

Document Type
Technical Report
Publication Date
Mar 24, 1987
Accession Number
ADA326339

Entities

People

  • A. Hauer
  • J. E. Swain
  • J. S. Wark
  • P. J. Solone
  • R. R. Whitlock

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Bragg Angle
  • Compression
  • Condensed Matter Physics
  • Crystal Lattices
  • Crystal Structure
  • Crystals
  • Diffraction
  • Laser Pulses
  • Latent Heat
  • Launching
  • Materials
  • Measurement
  • Phase Transformations
  • Radiation
  • Subatomic Particles
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Physics

Readers

  • Combustion Dynamics and Shock Wave Physics.
  • Pulsed Power and Plasma Physics.
  • Thin Film Deposition Science.

Technology Areas

  • AI & ML
  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition