Development and Application of In-Situ, Real Time and Ex-Situ Characterization Techniques to Study the Growth of High Temperature Superconducting (HTSC) Films and Interfaces,

Abstract

The objectives of this program are: (1) To demonstrate Time of Flight Ion Scattering and Recoil (ToF-ISARS) Spectroscopy and Spectroscopic Ellipsometry (SE) for in-situ and real time characterization of HTSC thin films and processes. (2) To study HTSC thin film processes and interface reactions.

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Document Details

Document Type
Technical Report
Publication Date
Jun 27, 1997
Accession Number
ADA326840

Entities

People

  • A. R. Krauss
  • Eugene A. Irene
  • G. E. Mcguire
  • O. Auciello

Organizations

  • University of North Carolina at Chapel Hill

Tags

DTIC Thesaurus Topics

  • Absorption
  • Dielectric Films
  • Diffusion
  • Films
  • High Temperature
  • Ion Beams
  • Materials
  • Materials Science
  • Military Research
  • New Mexico
  • North Carolina
  • Oxide Films
  • Scattering
  • Spectra
  • Spectroscopy
  • Thin Films
  • United States

Fields of Study

  • Physics

Readers

  • Positioning, Navigation, and Timing (PNT) Technology.
  • Semiconductor Device Technology
  • Superconducting Magnet Technology