Selected Energy Epitaxial Deposition and Low Energy Electron Microscopy of AlN, GaN and SiC Thin Films.

Abstract

Tight-binding ab initio molecular dynamics simulations involving a generalized multicenter tight-binding formalism which includes self-consistent charge transfer between the ions were used to investigate initial stages of growth of Group III nitrides. Initial results for the lattice constants, bulk modulus, phonon frequencies and electronic structure of the zincblende and wurtzite phase of bulk GaN and AlN are in good agreement with existing experimental data and highly converged plane wave calculations. The calculated relaxation parameters and formation energies determined for stoichiometric and nonstoichiometric geometries agree very well with density-functional calculations. Vacancy structures are the most stable configurations on the anion and cation terminated surfaces. The effectiveness of a supersonic seeded-beam jet and an RF plasma, connected independently to a low energy electron microscope (LEEM), were compared as sources of nitrogen for the growth of gallium nitride films on 6H-SiC(0001) substrates. Growth of GaN films on chemically vapor deposited GaN/AlN/SiC substrates was accomplished using triethylgallium and NH3-seeded supersonic molecular beams. The films were characterized by XPS, RHEED, SEM and AFM, and the effects of substrate temperature, NH3 flux and Ga flux on growth rate and film morphology examined. Typical GaN films grown at 700 deg C under NH3-limited conditions exhibited a rough, highly faceted surface morphology; smoother surfaces are obtained when the Ga flux was increased. Nitridation experiments on Si(100) wafers were conducted using monoenergetic and mass separated ion beams of N2(+) and N(+) produced in colutron ion sources. SIMS studies of the surfaces nitrided with both ions reveal slowly decaying nitrogen signals due to formation of SiN layers. Research is underway to deposit GaN layers by Ga(+) and N2(+) (or N(+)) beams.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1997
Accession Number
ADA328552

Entities

People

  • E. Bauer
  • E. Chen
  • H. Henry Lamb
  • I. S. Tsong
  • Robert F Davis

Organizations

  • North Carolina State University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Chemistry
  • Compound Semiconductors
  • Electron Microscopes
  • Electron Microscopy
  • Films
  • Frequency
  • Gallium Nitrides
  • Ion Beams
  • Kinetic Energy
  • Materials Science
  • Microscopes
  • Molecular Beams
  • Molecular Dynamics
  • Semiconductors
  • Silicon Carbide
  • Thin Films
  • Wide Bandgap Semiconductors

Fields of Study

  • Materials science

Readers

  • Quantum Chemistry
  • Semiconductor Device Technology
  • Thin Film Deposition Science.

Technology Areas

  • Hypersonics
  • Hypersonics - Hypersonic Flight
  • Microelectronics
  • Microelectronics - Graphene