Environmental Scanning Electron Microscope with Electrohydraulic Fatigue Loading Stage

Abstract

This instrumentation is a unique combination of an Environmental Scanning Electron Microscope (ESEM) with an electrohydraulic fatigue loading stage. The ESEM uses a patented technology that provides direct image capability in an environmental chamber that can contain gas or water vapor and in which temperature and pressure (to 50 Ton) can be varied. The computer controlled electrohydraulic loading stage can be operated in load, displacement or strain control. Resistance heating is used to control the specimen temperature (room temperature to 1150C). The combined ESEM and fatigue loading stage will provide direct on-line images (1 micron resolution) and quantitative data from test specimens under cyclic load (0 to 10 kN at 0 to 20 Hz). This unique system provides direct micro-level observational and loading conditions It is currently being used to study the micromechanisms of fatigue crack formation and fatigue damage development of existing and advanced materials. This system makes it possible to study materials systems in ways that have not previously been possible.

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Document Details

Document Type
Technical Report
Publication Date
May 14, 1997
Accession Number
ADA329847

Entities

People

  • B. M. Hillberry

Organizations

  • Purdue University

Tags

Communities of Interest

  • Human Systems

DTIC Thesaurus Topics

  • Advanced Materials
  • Aluminum Alloys
  • Computers
  • Electron Microscopes
  • Electrons
  • Engineering
  • Frequency
  • Materials
  • Materials Engineering
  • Mechanical Engineering
  • Microscopes
  • Optical Equipment
  • Optical Magnification Devices
  • Scanning
  • Scanning Electron Microscopes
  • Schools

Readers

  • Computational Modeling and Simulation
  • Materials Science (Mechanical Engineering).
  • Pavement Materials Engineering.

Technology Areas

  • Microelectronics