International IEEE Workshop on Experimentally Based FET Device Modelling & Related Nonlinear Circuit Design, 17-18 July 1997, Kassel, Germany

Abstract

Table of Contents: Workshop Opening; DC/SS- Device Characterization & Parasitics; Poster Opening; Signal Waveform and Pulsed Measurement & Load Pull; Noise Measurement & Nonlinear Noise in FETs; Optical Control of FETs; and Nonlinear Modeling and Circuit Design;

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1997
Accession Number
ADA331468

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Amplitude Modulation
  • Bandwidth
  • Circuit Analysis
  • Computational Fluid Dynamics
  • Computational Science
  • Electromagnetic Fields
  • Electronics Industry
  • Electronics Laboratories
  • Field Effect Transistors
  • High Electron Mobility Transistors
  • Laser Diodes
  • Metal-Semiconductor Junctions
  • Modules (Electronics)
  • Power Electronics
  • Radio Frequency Devices
  • Semiconductors
  • Two Dimensional

Readers

  • Academic Conference Management
  • Electronics Engineering