IN and SB Based III-V Microstructures with Novel Electronic Properties.

Abstract

The focus of this research project was to investigate the basic properties of InAs/GaInSb interfaces and how those properties effect the control of growing abrupt interfaces. STM and SIMS studies showed that InAs grown on GaSb tends to be less abrupt because the GaAs bond strengths are stronger than in GaSb. The As in InAs exchanges with underlying Ga atoms, while the displaced Sb is incorporated in the InAs. Atomic-layer epitaxy at higher temperatures tends to yield smoother interfaces. Electron spectroscopy for chemical analysis (ESCA) was used to detennine band offsets at !nAs/GaSb interfaces; the offset was 90 meV higher for InAs on GaSb than for the reversed order. The end result was an imn,roved recine for high-quality structures for infrared devices.

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Document Details

Document Type
Technical Report
Publication Date
Oct 16, 1997
Accession Number
ADA331625

Entities

People

  • T. C. Mcgill

Organizations

  • California Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Human Systems

DTIC Thesaurus Topics

  • Air Force
  • Atomic Layer Epitaxy
  • Band Gaps
  • California
  • Chemical Analysis
  • Chemistry
  • Compound Semiconductors
  • Electron Diffraction
  • Electron Spectroscopy
  • Electronic Mail
  • Energy Bands
  • High Temperature
  • Materials
  • Microstructure
  • Physics
  • Quantum Dots
  • Semiconductors

Fields of Study

  • Materials science

Readers

  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Semiconductor Device Technology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene