Vapour Phase Growth of Thick Monocrystalline GaN Epitaxial Layers by Sandwich-Method

Abstract

The basic investigations leading to the fabrication of thick (more than 0.2 mm) monocrystalline layers of GaN on the silicon carbide substrates are performed. GaN layers were grown by sublimation sandwich-method in ammonia atmosphere. GaN polycrystalline powder and metallic Ga were used as a vapor source. The growth was carried out in quartz reactors both horizontal, and vertical types, in furnaces with high-frequency heating. The possibility of growing of thick monocrystalline GaN layers at growth temperature range from 1200 to 1230 deg C without preliminary deposition of buffer layers with very high rates up to 1 mm/h is shown.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1997
Accession Number
ADA331761

Entities

People

  • A. D. Roenkov
  • E. N. Mokhov
  • M. E. Boiko
  • P. G. Baranov
  • Yu. A. Vodakov

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Crystal Structure
  • Crystals
  • Electron Microscopes
  • Electron Microscopy
  • Epitaxial Growth
  • Fabrication
  • Frequency
  • Magnetic Fields
  • Measurement
  • Optical Properties
  • Scattering
  • Semiconductors
  • Silicon Carbide
  • Temperature Gradients
  • Transition Temperature
  • Transitions

Fields of Study

  • Materials science

Readers

  • Surface Engineering/Surface Coating Technology.
  • Thin Film Deposition Science.