A Study of Advanced Semiconductor Switch Physics and Technology

Abstract

Russian ultra-fast, solid state switch technology was investigated in this study. Drift step recovery diodes (DSRDs) with silicon avalanche shapers (SASs) were experimentally examined. In addition, the SAS was studied using device-level modeling. The experiments and model results were compared with each other and with the Russian theory of operation. This research demonstrated that the Russian theory of the SAS was inconsistent with the operational behavior and circuit simulation. The SAS operates in a manner more consistent with a TRAPATT (TRApped Plasma Avalanche Triggered Transit) device. A simple circuit used to test the DSRD and SAS device is presented. Lifetime test results and switching voltage waveforms are discussed and evaluated. An optimum design for the SAS is offered based upon the theory of operation and code simulations. The University of New Mexico's drift diffusion furnace was used to construct a series of avalanche shapers similar in behavior to the Russian SAS. The results of this effort, including experimental data, are presented. Finally, a variety of commercialization opportunities for this fast semiconductor switch technology is offered.

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Document Details

Document Type
Technical Report
Publication Date
Sep 19, 1997
Accession Number
ADA331914

Entities

People

  • C. B. Fleddermann
  • Edl Schamiloglu
  • Jonathan Gaudet
  • R. Focia

Organizations

  • University of New Mexico

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Electronics Laboratories
  • Experimental Data
  • Fabrication
  • Integrated Circuits
  • Laser Applications
  • Laser Diodes
  • Lasers
  • Manufacturing
  • Modules (Electronics)
  • Power Electronics
  • Repetition Rate
  • Semiconductor Devices
  • Semiconductor Manufacturing
  • Semiconductors
  • Silicon Controlled Rectifiers
  • Simulations
  • Transducers

Readers

  • Electrical Engineering
  • Semiconductor Device Technology
  • Traumatic Brain Injury (TBI) and Cognitive Aging in the Guam and Border Populations Affected by Alzheimer's Disease and Tau-Associated Dementias.

Technology Areas

  • Microelectronics