Particulate Contaminant Formation and Transport in Microelectronic Manufacturing Processes. Phase 2.

Abstract

This is the seventh quarterly report documenting the work performed during a two year Phase II STTR activity entitled "Particulate contaminant formation and transport in microelectronic manufacturing processes." The overall objective is to produce a charging, transport, and growth simulation (CTGS) tool that can be used effectively by equipment manufacturers and users to reduce particle generation in fabrication systems. The project includes collaborations with Prof. Steven Girshick (University of Minnesota) on ion induced nucleation and Prof. Mark J. Kushner (University of Illinois) on particle charging and transport.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1997
Accession Number
ADA332382

Entities

People

  • Aishwarya Krishnan
  • M. J. Kushner
  • N. P. Rao
  • P. J. Stout
  • S. L. Girshick

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Chemical Reactions
  • Chemical Vapor Deposition
  • Chemistry
  • Computational Fluid Dynamics
  • Contractors
  • Fabrication
  • Fluid Dynamics
  • Fluid Flow
  • Graphical User Interface
  • Manufacturing
  • Mass Transfer
  • Materials
  • Particle Size
  • Particles
  • Particulates
  • Surface Chemistry
  • Three Dimensional

Readers

  • Aerosol Science/Aerosol Physics
  • Research Science/Academic Research
  • Software Engineering

Technology Areas

  • Microelectronics