Defect Induced Lowering of Activation Energies at Step Bands in Co/Cu(100)

Abstract

Complex topological features such as rectangular voids and step inclusions that were seen in secondary electron micrographs of Co films grown on Cu(100) at room temperature were reproduced in Monte Carlo simulations in the presence of step bands. Lowered activation energies at defects such as steps, kinks, and vacancies enhance step edge restructuring during growth and upon annealing. This results in features such as faceted step edges, rectangular pits, incorporation of Co into terraces, surface alloying, and surface segregation. Simulated growth structures are directly compared with those observed in an ultrahigh vacuum scanning transmission electron microscope.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1997
Accession Number
ADA332707

Entities

People

  • James L. Blue
  • M. R. Scheinfein
  • S. T. Coyle

Organizations

  • Arizona State University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Annealing
  • Electron Beams
  • Electron Microscopes
  • Electrons
  • Energy
  • Free Energy
  • Gray Scale
  • Heat Of Activation
  • High Density
  • High Resolution
  • Magnetic Properties
  • Monte Carlo Method
  • Random Walk
  • Simulations
  • Single Crystals
  • Substrates
  • Three Dimensional

Fields of Study

  • Materials science
  • Physics

Readers

  • Computational Fluid Dynamics (CFD)
  • Materials Science and Engineering.
  • Powder metallurgy of Titanium alloys.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene