Laser Diode Assembly Testing and Characterization.
Abstract
An investigation has been conducted to study the response of two Laser Diode Assembly (LDA) components over a range of nominal operating conditions. Each LDA was comprised of a multi-stripe gain guided laser diode array coupled to a length of multi-mode fiber. The components were tested over a temperature-current parameter space. The LDAs were modulated at a rate of 12.5 Mega Bits per Second with a 50% duty cycle. The results of this study could be used as a basis for a mitigation strategy to compensate for Bit Error Rates (BER) compromised by temperature variations and other effects for a spaceborne laser communications link.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 28, 1997
- Accession Number
- ADA332992
Entities
People
- Amey R. Peltzer
- G. Charmaine Gilbreath
- Joshua H. Resnick
- Michael R. Corson
- Peter B. Rolsma
Organizations
- United States Naval Research Laboratory