Optical Characterization of the Air-Sea Interface,

Abstract

Optical techniques to measure short wave structure have been developed into working in situ devices in recent years. These devices generally fall into two categories, one category contains devices that make instantaneous 'maps' of surface slope in two dimensional space, and the other category makes time and space series of surface slope at a single point. This paper describes results obtained with a device from the latter category. Data analysis is performed to compute an estimate of surface curvature and it is compared to a short-time scale measurement of wind speed and microlayer chemical enrichment.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1996
Accession Number
ADA333455

Entities

People

  • Erik J. Bock
  • Wade R. Mcgillis

Organizations

  • Woods Hole Oceanographic Institution

Tags

Communities of Interest

  • Energy and Power Technologies
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Boundary Layer
  • Capillary Waves
  • Curvature
  • Data Analysis
  • Directional
  • Energy
  • Fluorescence
  • Gravity Waves
  • Measurement
  • Remote Sensing
  • Scanning
  • Scattering
  • Statistics
  • Surface Active Substances
  • Surface Tension
  • Wave Propagation
  • Waves

Readers

  • Approximation Theory.
  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Space