Gallium Arsenide Nitride: A New Material for Optical Interconnects on Silicon Circuits.
Abstract
A proposed direct bandgap ternary material, lattice matchable to silicon, was explored in this exploratory effort. About a dozen molecular beam epitaxy growth runs were performed on gallium arsenide and gallium phosphide, and growths analyzed via Auger spectroscopy, x-ray diffraction, and transmission electron microscopy. Up to 20% nitrogen was Incorporated. Single crystal quality material with about 2% nitrogen was detected. Segregation into gallium nitride and gallium arsenide was always seen.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1997
- Accession Number
- ADA337171
Entities
People
- J. M. Ballantyne
Organizations
- Cornell University