High Resolution Studies of Thin Film Interfaces

Abstract

This research program was generally concerned with the application of Ballistic Electron Emission Microscopy (BEEM) and related scanning tunneling microscopy (STM) techniques to the study of interfacial ballistic transport in a range of electronic materials, and with the extension of BEEM to locally examine aspects, consequences, and possible applications of elastic and inelastic electronic scattering processes at both Schottky barrier interfaces and thin film overlayers.

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Document Details

Document Type
Technical Report
Publication Date
Mar 02, 1998
Accession Number
ADA338838

Entities

People

  • R. A. Buhrman

Organizations

  • Cornell University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Elastic Scattering
  • Electron Emission
  • Electronic Materials
  • Electrons
  • Films
  • Grain Boundaries
  • High Resolution
  • Implantation
  • Ion Beams
  • Ions
  • Materials
  • Measurement
  • Photoexcitation
  • Scattering
  • Semiconductors
  • Thin Films
  • Transport Ships

Readers

  • Materials Science and Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene