Diagnostic Simulation of Sequential Circuits Using Fault Sampling

Abstract

This paper describes a technique to accelerate diagnostic fault simulation of sequential circuits using fault sampling. Diagnostic fault simulation involves computing the indistinguishability relationship between all pairs of modeled faults. The input space is the set of all pairs of mode led faults, thus making the simulation computationally intensive. The diagnostic simulation process is accelerated by considering a sub space of the input space that is obtained using fault sampling. Results on performance speedup and diagnostic resolution loss are provided for the ISCAS 89 benchmark circuits.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1998
Accession Number
ADA339323

Entities

People

  • Janak H. Patel
  • Srikanth Venkataraman
  • W. Kent Fuchs

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Distribution Functions
  • Equations
  • Errors
  • Military Research
  • Normal Distribution
  • Probability
  • Probability Distribution Functions
  • Probability Distributions
  • Random Variables
  • Sampling
  • Simulations
  • Simulators
  • Statistical Samples
  • Statistical Sampling
  • Test Sets

Fields of Study

  • Engineering

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Computational Modeling and Simulation
  • Critical Infrastructure Protection in CBRN and WMD Threats.

Technology Areas

  • Space