Cavity Lifetime Phase-Shift Method for Sensitive Reflectance Measurements at Mid-infrared Wavelengths
Abstract
The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2.9-micron wavelength is described.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 14, 1981
- Accession Number
- ADA339847
Entities
People
- J. M. Herbelin
- M. A. Kwok
- R. H. Ueunten
Organizations
- The Aerospace Corporation