Macromodeling Electromagnetic Effects in Circuits

Abstract

This report presents results of an investigation to develop CAD macromodels for simulating and assessing electromagnetic (EM) effects in linear and digital ICs. The effects of interest are any unintended IC responses due to inadvertently (or intentionally) coupled EM energy entering into any accessible ports on the victim circuit. Assessments of possible EM effects require robust methodology to encompass a variety of coupling waveforms and conditions. In this study, both Thevenin and Norton sources were used as equivalent circuits for coupling the intrusive EM fields. Both digital and linear ICs were used as victim circuits to determine and benchmark performance of the candidate macros. Three ICs of representative families, however, were specifically selected for bench marking because they are used in current and planned Air Force Systems. In addition, other contemporary linear ICs and OpAmp's were used in various circuit configurations to demonstrate use of the (EM) assessment macromodels.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1997
Accession Number
ADA341551

Entities

People

  • Daniel J. Kennealky

Organizations

  • Calspan-University of Buffalo Research Center

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Bipolar Junction Transistors
  • Circuit Analysis
  • Command And Control
  • Computer Programs
  • Computers
  • Control Systems
  • Digital Circuits
  • Electromagnetic Properties
  • Electronics Industry
  • Field Effect Transistors
  • Logic Gates
  • Operating Systems
  • Power Electronics
  • Semiconductor Devices
  • Semiconductors
  • Systems Engineering

Readers

  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design