Electronic Applications of Magnetic Resonance Force Microscopy.
Abstract
This is the final report for Office of Naval Research Contract N0001495-C- 0124. Work under this recently completed contract has focused on improving the basic technology of magnetic resonance force microscopy (MRFM) and working towards the dual goals of dopant detection ill silicon and single electron spin detection. In addition, a number of important advances were achieved, including ultrasensitive force detection, magnetic resonance characterization of dangling bond defects in SiO2, and two and three-dimensional imaging of both paramagnetic and ferromagnetic resonance on the micronscale. Magnetic resonance force microscopy1, 2, 3 (MRPM) is a new scanning probe microscope technique that combines aspects of magnetic resonance imaging (MRI) and atomic force microscopy (APM). IBM's interest in MRFM is driven by the possibility of achieving non-invasive, three-dimensional imaging with atomic-resolution and elemental selectivity. If this goal can be realized, the technique would have a revolutionary impact on the field of microscopy and have many important applications. Potential applications include: 1) determining the sub-surface, three-dimensional structure of solid state materials, 2) imaging three-dimensional distributions of dopants in semiconductors with angstrom spatial resolution, 3) imaging defects and trapping sites in semiconductors, 4) imaging interactions between polymer molecules, 5) determining the three-dimensional atomic structure of macromolecules, such as proteins.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1997
- Accession Number
- ADA342486
Entities
Organizations
- International Business Machines Corporation (Armonk, NY)