Infrared Spectropolarimetry

Abstract

A new instrument, a Fourier transform infrared (FTIR) spectropolarimeter, has been developed to characterize the elements of polarization critical optical systems. The rotating sample spectropolarimeter measures linear diattenuation (polarization) and linear retardance spectra of samples over a spectral range from 2.5 to 20um. The dual rotating retarder spectropolarimeter measures Mueller matrix spectra from 3 to 14um. This information provides essential data on the wavelength response of polarization elements and the modulation characteristics of spatial light modulators as a function of wavelength. This dissertation describes data reduction algorithms for the rotating sample and dual rotating retarder polarimeters. The discussion includes description of common sources of systematic errors in polarimetric systems and how many of these errors are reduced or removed through the choice of appropriate measurement parameters and Fourier analysis of the polarimetric signal. The data reduction algorithms for spectropolarimetric measurements incorporate the wavelength dependence of the polarization elements. Self calibration data reduction methods are also described. Linear diattenuation, linear retardance, and linear birefringence spectra of cadmium sulfide and cadmium selenide multiple order waveplates and three liquid crystal materials are presented. Linear diattenuation and linear retardance calibration spectra of the polarization elements used in the spectropolarimeter, an infrared wire grid polarizer on a zinc selenide substrate and an infrared achromatic quarter wave retarder, are also given. Mueller matrix spectra of a cadmium telluride modulator are given as a function of voltage. The electrooptic coefficient spectrum of cadmium telluride calculated from the Mueller matrix spectra is presented.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1992
Accession Number
ADA342934

Entities

People

  • David Blair Chenault

Organizations

  • University of Alabama in Huntsville

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Birefringence
  • Composite Materials
  • Compound Semiconductors
  • Computational Science
  • Computer Programs
  • Detectors
  • Electro-Optic Modulators
  • Fourier Analysis
  • Light Sources
  • Measurement
  • Optical Materials
  • Optics
  • Polarizers
  • Refraction
  • Refractive Index
  • Spectra

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Materials Science and Engineering.
  • Optical Physics and Photonics.