Overview of Device SEE Susceptibility from Heavy Ions

Abstract

A fifth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications (1,2,3,4) in December issues for 1985, 1987, 1989, and 1991. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are evaluated.

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Document Details

Document Type
Technical Report
Publication Date
Jan 15, 1998
Accession Number
ADA345739

Entities

People

  • D. K. Nichols
  • H. R. Schwartz
  • J. R. Coss
  • K. P. Mccarthy
  • L. S. Smith

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Air Force
  • California
  • Chemical Reactions
  • Compound Semiconductors
  • Detectors
  • Electronics Laboratories
  • Energy
  • Jet Propulsion
  • Materials
  • Materials Processing
  • Microelectromechanical Systems
  • Physics Laboratories
  • Semiconductor Devices
  • Semiconductors
  • Space Systems
  • Test And Evaluation
  • Test Facilities

Fields of Study

  • Physics

Readers

  • Business Analytics
  • Environmental Engineering
  • Integrated Circuit Design and Technology.